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Semiconsoft  
Semiconsoft, Inc.是世界上薄膜厚度分析軟件和薄膜測量硬件解決方案的領導者。公司的TFCompanion軟件被大多數的計量學公司以及國際知名的R&D組織采用，應用領域遍布半導體、生物技術、數據存儲、顯示、化學以及光學鍍膜工業等。從最復雜的光譜學以及成像學橢偏儀到小而廉價的光纖光學發射計，我們的計量學儀器生產線集成了世界上最好的、最先進的硬件工藝，界面友好、功能強大而且簡單易用。
成立于2001年的Semiconsoft公司坐落在麻省的Southborough，起初主要提供薄膜分析軟件以及為半導體R&D以及生產公司提供服務，2002年公司開始生產TFCompanion軟件，并且在這個領域始終持續保持前進的勢頭，不斷增加新的功能，軟件被公認為薄膜測量領域的領導者。2004年，公司發布了誤差評估模塊來預測不同測量環境下的測量精確度。2005年，公司與知名的硬件制造商合作，爭取以系統集成的方式為客戶的薄膜測量技術提供最優化的解決方案。

Semiconsoft, Inc.is a world leader in providing thin films data analysis software and thin-films measurement hardware solutions. Our TFCompanion software is used by many major metrology companies and leading R&D organizations, in semiconductor, biotechnology, data storage, display, chemistry and optical coating industries.Our line of metrology instruments from the most sophisticated spectroscopic and imaging ellipsometers to small and cost effective fiber-optics reflectometers combines the best and latest hardware technology with the user friendly, powerful, yet, easy to use software.

Semiconsoft, Inc. is a privately held company with headquarters in Southborough, Massachusetts. It was founded in 2001 with the mission to provide thin-film analysis software and services for semiconductor R&D and production. TFCompanion software was introduced in 2002. We continue active development of TFCompanion and constantly adding new features and capabilities. It is recognized as a leading thin-film data analysis software. One of the challenges of optical metrology, as an indirect measurement technique, is the selection of measurement methods and conditions to achieve optimal precision on specific application: this problem is faced by metrology manufacturers, production users or researchers alike. In 2004 we have introduced an ErrorEstimator module that allows to estimate accurately the measurement precision depending on measurement condition, application and technique. In 2005 we partnered with the leading hardware manufacturers to combine the recent advances in hardware and software and offer a full line of modular thin-film measurement solutions that can be customized for specific application. PicoProbe series of single wavelength and spectroscopic systems offer unparalleled speed and precision, PicoScan imaging ellipsometer system offer high spatial resolution, M-Probe spectral reflectometer systems offer small, precise and affordable solution for in-situ and ex-situ measurement, TR-Probe offer application customized high-precision reflectometer systems for the wide spectral range.